16th APMP NMI Directors' Workshop 2025
Meeting documents
Draft Programme_NMI Directors' Workshop 2025.pdf
The 16th APMP NMI Directors’ Workshop.pdf
Session 1.1 - Development of SEM-based Technologies for Addressing Metrological Challenges in the Semiconductor Industry_Dr. In-Yong Park.pdf
Session 1.2 - Innovative Metrology Approaches with Potential to Support Semiconductor Industry Progress_Dr. Megumi Akoshima.pdf
Session 2.1 - Metrology Challenges for Emerging Semiconductors_Prof. Fernando.pdf
Session 2.2 - Activities within the CIPM’s Consultative Committees that support metrology for the semiconductor industry_Dr. Victoria Coleman.pdf
Session 2.3 - Strengthening Traceability in Malaysia’s Semiconductor Ecosystem_Mr. Razman Mohd Halim.pdf
Session 2.4 - Metrology for advanced electronics-the NIST perspective_Dr. James Kushmerick.pdf
