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Home TC meetings & workshops TCMM 2023 Workshop (Hybrid), Shenzhen, China

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2023 Workshop (Hybrid), Shenzhen, China

Meeting documents

TCMM Workshop Agenda-V6-Final.pdf (2.1) Step height measurement of monoatomic silicon lattice steps (NMIA).pdf (2.2) Immersive visualisation for Metrological Scanning Probe Microscopy data sets (NMIA).pdf (6) Practical application of nanometrology-Nanoparticle inspection using DMA (CMS-ITRI).pdf